Jeong, Hyun-Jun
Kim, Beom-Su
Han, Ki-Lim
Oh, Saeroonter
Park, Jin-Seong https://orcid.org/0000-0002-9070-5666
Funding for this research was provided by:
Ministry of Trade, Industry and Energy (10051403)
National Research Foundation of Korea (2017R1D1A1B03034035)
Article Title: Quantitative analysis of interface trap recovery caused by repetitive bending stress in flexible oxide thin-film transistors
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2019 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2018-12-26
Date Accepted: 2019-02-14
Online publication date: 2019-04-08