Kanechika, Masakazu
Yamaguchi, Satoshi
Imanishi, Masayuki
Mori, Yusuke
Funding for this research was provided by:
Japan Science and Technology Agency (JPMJAL1201)
Article Title: Evaluation of dislocations under the electrodes of GaN pn diodes by X-ray topography
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2019 The Japan Society of Applied Physics
Publication dates
Date Received: 2018-12-30
Date Accepted: 2019-03-01
Online publication date: 2019-05-23