Uraoka, Yukiharu
Bermundo, Juan Paolo
Fujii, Mami N. http://orcid.org/0000-0001-8112-3288
Uenuma, Mutsunori http://orcid.org/0000-0002-3387-6805
Ishikawa, Yasuaki
Journal title: Japanese Journal of Applied Physics
Article type: rev
Article title: Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression
Copyright information: © 2019 The Japan Society of Applied Physics
Publication dates
Date received: 2019-02-08
Date accepted: 2019-04-03
Online publication date: 2019-05-09