Oshima, Kunihiro
Shintani, Michihiro
Kuribara, Kazunori https://orcid.org/0000-0003-2746-1467
Ogasahara, Yasuhiro
Sato, Takashi
Article Title: Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2020 The Japan Society of Applied Physics. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-10-01
Date Accepted: 2019-12-20
Online publication date: 2020-02-05