Oshima, Kunihiro
Shintani, Michihiro
Kuribara, Kazunori https://orcid.org/0000-0003-2746-1467
Ogasahara, Yasuhiro
Sato, Takashi
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages
Copyright information: © 2020 The Japan Society of Applied Physics
Publication dates
Date received: 2019-10-01
Date accepted: 2019-12-20
Online publication date: 2020-02-05