Hainey, Mel Jr.
Robin, Yoann
Amano, Hiroshi
Usami, Noritaka
Funding for this research was provided by:
Japan Society for the Promotion of Science
Journal title: Applied Physics Express
Article type: lett
Article title: Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy
Copyright information: © 2019 The Japan Society of Applied Physics
Publication dates
Date received: 2018-11-22
Date accepted: 2018-12-28
Online publication date: 2019-01-25