Journal title: Applied Physics Express
Article type: lett
Article title: Wafer-scale analysis of GaN substrate wafer by imaging cathodoluminescence
Copyright information: © 2019 The Japan Society of Applied Physics
License information: cc-by Content from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Publication dates
Date received: 2019-03-01
Date accepted: 2019-03-07
Online publication date: 2019-04-09