Funding for this research was provided by:
RIKEN (SPDR program)
Japan Society for the Promotion of Science (Kakenhi/18K04251)
Journal title: Applied Physics Express
Article type: lett
Article title: Random electric field induced by interface roughness in GaN/AlxGa1−xN multiple quantum wells
Copyright information: © 2019 The Japan Society of Applied Physics
Publication dates
Date received: 2019-10-03
Date accepted: 2019-11-04
Online publication date: 2019-11-21