Chen, Da https://orcid.org/0000-0002-0334-9502
Wang, Dadi https://orcid.org/0000-0001-5255-0483
Chang, Yongwei https://orcid.org/0000-0002-0891-8663
Li, Ya https://orcid.org/0000-0001-8138-6600
Ding, Rui https://orcid.org/0000-0001-6043-5629
Li, Jiurong https://orcid.org/0000-0003-3552-0797
Chen, Xiao https://orcid.org/0000-0002-5658-4573
Wang, Gang https://orcid.org/0000-0002-2288-3807
Guo, Qinglei https://orcid.org/0000-0002-5284-3929
Journal title: Applied Physics Express
Article type: lett
Article title: Exceptional cracking behavior in H-implanted Si/B-doped Si0.70Ge0.30/Si heterostructures
Copyright information: © 2018 The Japan Society of Applied Physics
Publication dates
Date received: 2017-10-10
Date accepted: 2017-11-09
Online publication date: 2017-11-28