Ueno, Kazuyoshi
Fujishima, Shota
Yamashita, Makoto
Mitsumori, Akiyoshi
Article Title: Reliability tests of electroless barriers against copper diffusion under bias-temperature stress with n- and p-type substrates
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2016 The Japan Society of Applied Physics
Publication dates
Date Received: 2015-08-12
Date Accepted: 2016-02-12
Online publication date: 2016-03-30