Yoshida, Shinichi
Taniguchi, Satoshi
Minari, Hideki
Lin, Dennis
Ivanov, Tsvetan
Watanabe, Heiji
Nakazawa, Masashi
Collaert, Nadine
Thean, Aaron
Article Title: The impact of energy barrier height on border traps in the metal insulator semicondoctor gate stacks on III–V semiconductors
Journal Title: Japanese Journal of Applied Physics
Article Type: paper
Copyright Information: © 2016 The Japan Society of Applied Physics
Publication dates
Date Received: 2015-11-30
Date Accepted: 2016-01-09
Online publication date: 2016-05-19