Maekawa, Keiichi
Makiyama, Hideki
Yamamoto, Yoshiki
Hasegawa, Takumi
Okanishi, Shinobu
Sonoda, Kenichiro
Shinkawata, Hiroki
Yamashita, Tomohiro
Kamohara, Shiro
Yamaguchi, Yasuo
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Comprehensive analysis of low-frequency noise variability components in bulk and fully depleted silicon-on-insulator metal–oxide–semiconductor field-effect transistor
Copyright information: © 2018 The Japan Society of Applied Physics
Publication dates
Date received: 2017-10-10
Date accepted: 2018-01-11
Online publication date: 2018-03-19