Ichino, Shinya
Mawaki, Takezo
Teramoto, Akinobu
Kuroda, Rihito
Park, Hyeonwoo
Wakashima, Shunichi
Goto, Tetsuya
Suwa, Tomoyuki
Sugawa, Shigetoshi
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors
Copyright information: © 2018 The Japan Society of Applied Physics
Publication dates
Date received: 2017-10-10
Date accepted: 2018-01-06
Online publication date: 2018-03-14