Lei, Zhifeng
Guo, Hongxia
Tang, Minghua
Peng, Chao
Zhang, Zhangang
Huang, Yun
En, Yunfei
Journal title: Japanese Journal of Applied Physics
Article type: paper
Article title: Mechanism of high-fluence proton induced electrical degradation in AlGaN/GaN high-electron-mobility transistors
Copyright information: © 2018 The Japan Society of Applied Physics
Publication dates
Date received: 2018-01-31
Date accepted: 2018-03-21
Online publication date: 2018-06-11