The Evolution of Scanning Ion Conductance Microscopy
Crossref DOI link: https://doi.org/10.1007/11663_2022_14
Published Online: 2022-07-28
Published Print: 2022
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dietzel, Irmgard D.
Happel, Patrick
Schäffer, Tilman E.
Text and Data Mining valid from 2022-01-01
Version of Record valid from 2022-01-01
Chapter History
First Online: 28 July 2022