Using X-Ray Microscopy to Increase Targeting Accuracy in Serial Block-Face Scanning Electron Microscopy
Crossref DOI link: https://doi.org/10.1007/978-1-0716-0691-9_10
Published Online: 2020-06-30
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bushong, Eric A.
Phan, Sébastien
Ellisman, Mark H.
Text and Data Mining valid from 2020-01-01
Version of Record valid from 2020-01-01
Chapter History
First Online: 30 June 2020