Variable Pressure Scanning Electron Microscopy (VPSEM)
Crossref DOI link: https://doi.org/10.1007/978-1-4939-6676-9_12
Published Online: 2017-11-18
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Goldstein, Joseph I.
Newbury, Dale E.
Michael, Joseph R.
Ritchie, Nicholas W. M.
Scott, John Henry J.
Joy, David C.
Text and Data Mining valid from 2017-11-18
Version of Record valid from 2017-11-18
Chapter History
First Online: 18 November 2017