High-Resolution AFM-Based Force Spectroscopy
Crossref DOI link: https://doi.org/10.1007/978-1-4939-8591-3_4
Published Online: 2018-06-29
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sigdel, Krishna P.
Pittman, Anna E.
Matin, Tina R.
King, Gavin M.
License valid from 2018-01-01