Serial Femtosecond Crystallography (SFX): An Overview
Crossref DOI link: https://doi.org/10.1007/978-3-030-00551-1_2
Published Online: 2018-12-28
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hunter, Mark S.
Fromme, Petra
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