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Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

Crossref DOI link: https://doi.org/10.1007/978-3-030-15612-1_6

Published Online: 2019-08-01

Published Print: 2019

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Martin, Simon

Gautier, Brice

Baboux, Nicolas

Gruverman, Alexei

Carretero-Genevrier, Adrian

Gich, Martí

Gomez, Andres
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Text and Data Mining valid from 2019-01-01
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First Online: 1 August 2019