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1-GRad-TID Effects in 28-nm Device Study for Rad-Hard Analog Design

Crossref DOI link: https://doi.org/10.1007/978-3-030-25267-0_18

Published Online: 2019-10-25

Published Print: 2020

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

De Matteis, Marcello

Resta, F.

Pipino, A.

Fary, F.

Mattiazzo, S.

Enz, C.

Baschirotto, A.
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Text and Data Mining valid from 2019-10-25
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First Online: 25 October 2019