Dislocation-Based Thermodynamic Models of V-Pits Formation and Strain Relaxation in InGaN/GaN Epilayers on Si Substrates
Crossref DOI link: https://doi.org/10.1007/978-3-030-36296-6_188
Published Online: 2020-02-12
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khafagy, Khaled H.
Hatem, Tarek M.
Bedair, Salah M.
Text and Data Mining valid from 2020-01-01
Chapter History
First Online: 12 February 2020