Scanning Electron Microscopy and Complementary In Situ Characterization Techniques for Characterization of Deformation and Damage Processes
Crossref DOI link: https://doi.org/10.1007/978-3-030-42603-3_15
Published Online: 2020-05-30
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Weidner, Anja
Lehnert, Robert
Biermann, Horst
Text and Data Mining valid from 2020-01-01
Version of Record valid from 2020-05-30
Chapter History
First Online: 30 May 2020