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Authors
Singh, Divya http://orcid.org/0000-0003-4058-7312
Paul, Sajal K. http://orcid.org/0000-0001-5674-4656
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More Information
Chapter History
First Online: 17 December 2022
Conference Information
Conference Acronym: VDAT
Conference Name: International Symposium on VLSI Design and Test
Conference City: Jammu
Conference Country: India
Conference Year: 2022
Conference Start Date: 17 July 2022
Conference End Date: 19 July 2022
Conference Number: 26
Conference ID: vdat2022
Conference URL: https://iitjammu.ac.in/vdat2022/
Peer Review Information (provided by the conference organizers)
Type: Double-blind
Conference Management System: Easychair
Number of Submissions Sent for Review: 220
Number of Full Papers Accepted: 32
Number of Short Papers Accepted: 16
Acceptance Rate of Full Papers: 15% - The value is computed by the equation "Number of Full Papers Accepted / Number of Submissions Sent for Review * 100" and then rounded to a whole number.
Average Number of Reviews per Paper: 3
Average Number of Papers per Reviewer: 4
External Reviewers Involved: Yes
