Kumar, Gaurav http://orcid.org/0000-0002-2357-6382
Kumar, Anuj http://orcid.org/0000-0002-1785-370X
Ahlawat, Satyadev http://orcid.org/0000-0003-0186-1446
Prasad, Yamuna http://orcid.org/0000-0002-3709-7956
Chapter History
First Online: 17 December 2022
Conference Information
Conference Acronym: VDAT
Conference Name: International Symposium on VLSI Design and Test
Conference City: Jammu
Conference Country: India
Conference Year: 2022
Conference Start Date: 17 July 2022
Conference End Date: 19 July 2022
Conference Number: 26
Conference ID: vdat2022
Conference URL: https://iitjammu.ac.in/vdat2022/
Peer Review Information (provided by the conference organizers)
Type: Double-blind
Conference Management System: Easychair
Number of Submissions Sent for Review: 220
Number of Full Papers Accepted: 32
Number of Short Papers Accepted: 16
Acceptance Rate of Full Papers: 15% - The value is computed by the equation "Number of Full Papers Accepted / Number of Submissions Sent for Review * 100" and then rounded to a whole number.
Average Number of Reviews per Paper: 3
Average Number of Papers per Reviewer: 4
External Reviewers Involved: Yes