Critical Discussion of Ex situ and In situ TEM Measurements on Memristive Devices
Crossref DOI link: https://doi.org/10.1007/978-3-031-36705-2_5
Published Online: 2023-09-20
Published Print: 2024
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gronenberg, Ole
Haberfehlner, Georg
Zahari, Finn
Marquardt, Richard
Kübel, Christian
Kothleitner, Gerald
Kienle, Lorenz
Text and Data Mining valid from 2023-09-20
Version of Record valid from 2023-09-20
Chapter History
First Online: 20 September 2023