Active Probe AFM Imaging and Nanofabrication
Crossref DOI link: https://doi.org/10.1007/978-3-031-44233-9_10
Published Online: 2024-02-07
Published Print: 2024
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xia, Fangzhou
Rangelow, Ivo W.
Youcef-Toumi, Kamal
Text and Data Mining valid from 2024-01-01
Version of Record valid from 2024-01-01
Chapter History
First Online: 7 February 2024