Toward Explainable Metrology 4.0: Utilizing Explainable AI to Predict the Pointwise Accuracy of Laser Scanning Devices in Industrial Manufacturing
Crossref DOI link: https://doi.org/10.1007/978-3-031-46452-2_27
Published Online: 2024-02-09
Published Print: 2024
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lavasa, Eleni
Chadoulos, Christos
Siouras, Athanasios
Etxabarri Llana, Ainhoa
RodrÃguez Del Rey, Silvia
Dalamagas, Theodore
Moustakidis, Serafeim
Text and Data Mining valid from 2024-01-01
Version of Record valid from 2024-02-09
Chapter History
First Online: 9 February 2024