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Beam-Induced Motion Mechanism and Correction for Improved Cryo-Electron Microscopy and Cryo-Electron Tomography

Crossref DOI link: https://doi.org/10.1007/978-3-031-51171-4_10

Published Online: 2024-05-01

Published Print: 2024

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Zheng, Shawn

Brilot, Axel

Cheng, Yifan

Agard, David A. https://orcid.org/0000-0003-3512-695X
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Text and Data Mining valid from 2024-01-01

Version of Record valid from 2024-01-01
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Chapter History

First Online: 1 May 2024

Compliance with Ethical Standards

: The authors declare no competing interests.