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An Integrated Active Learning Framework for the Deployment of Machine Learning Models for Defect Detection in Manufacturing Environments

Published Online: 2024-06-27

Published Print: 2024

Authors

Fragueiro, Fabián González

Martín, Daniel Gordo

López, Alberto Botana

Rial, Adrián Alonso

Tranchero, Jacobo Otero

Lorenzo, Betty Cortiñas

Montenegro, Juan Manuel Fernández

Muiños-Landin, Santiago
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Text and Data Mining valid from 2024-01-01

Version of Record valid from 2024-01-01
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Chapter History

First Online: 27 June 2024

Conference Information

Conference Acronym: ESAIM

Conference Name: European Symposium on Artificial Intelligence in Manufacturing

Conference City: Kaiserslautern

Conference Country: Germany

Conference Year: 2023

Conference Start Date: 19 September 2023

Conference End Date: 19 September 2023

Conference ID: esaim2023

Conference URL: https://www.aim-net.eu/symposium2023/

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