Optimum Switch Self-check Interval for Safety–Critical Device Mission Reliability
Crossref DOI link: https://doi.org/10.1007/978-3-031-72636-1_10
Published Online: 2025-01-21
Published Print: 2025
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Fengbin
Glassman, Matt
Text and Data Mining valid from 2025-01-01
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Chapter History
First Online: 21 January 2025