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Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance

Crossref DOI link: https://doi.org/10.1007/978-3-031-74640-6_36

Published Online: 2025-01-01

Published Print: 2025

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Dey, Bappaditya

Tuan Ngo, Anh

Sacchi, Sara

Blanco, Victor

Leray, Philippe

Halder, Sandip
License Information

Text and Data Mining valid from 2025-01-01

Version of Record valid from 2025-01-01

Text and Data Mining valid from 2025-01-01

Version of Record valid from 2025-01-01
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Chapter History

First Online: 1 January 2025

Conference Information

Conference Acronym: ECML PKDD

Conference Name: Joint European Conference on Machine Learning and Knowledge Discovery in Databases

Conference City: Turin

Conference Country: Italy

Conference Year: 2023

Conference Start Date: 18 September 2023

Conference End Date: 22 September 2023

Conference Number: 23

Conference ID: ecml2023

Conference URL: https://2023.ecmlpkdd.org/