Structural and Chemical Defect Characterization for Selectively Doped GaN
Crossref DOI link: https://doi.org/10.1007/978-3-031-83056-3_21
Published Online: 2025-04-23
Published Print: 2025
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yekan
Huynh, Kenny
Liao, Michael
Goorsky, Mark
Text and Data Mining valid from 2025-01-01
Version of Record valid from 2025-01-01
Chapter History
First Online: 23 April 2025