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X-Ray Topography and High-Resolution X-Ray Diffraction Characterization of GaN Materials for Power Electronics Applications

Crossref DOI link: https://doi.org/10.1007/978-3-031-83056-3_6

Published Online: 2025-04-23

Published Print: 2025

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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