Document is current

Any future updates will be listed below

The Formation and Utilization of Defects and Tracks During the Ion Implantation of Diamond and c-BN Thin Films

Crossref DOI link: https://doi.org/10.1007/978-3-031-88283-8_7

Published Online: 2025-07-21

Published Print: 2025

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark