Document is current

Any future updates will be listed below

Influences of Titanium Dioxide/Silicon Dioxide/Alumina TiO2/SiO2/Al2O3 Thin Film Thickness on Structural and Absorbance Characteristics of Silicon Nitride Layer

Crossref DOI link: https://doi.org/10.1007/978-3-032-09633-3_5

Published Online: 2026-01-24

Published Print: 2026

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark