High-Resolution Inelastic X-Ray Scattering I: Context, Spectrometers, Samples, and Superconductors
Crossref DOI link: https://doi.org/10.1007/978-3-319-04507-8_41-2
Published Online: 2019-04-29
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Baron, Alfred Q. R.
Text and Data Mining valid from 2019-01-01
Chapter History
Received: 3 August 2018, 00:00:00
Accepted: 16 October 2018, 00:00:00
First Online: 29 April 2019