Nanoelectronic Coupled Problem Solutions: Uncertainty Quantification of RFIC Interference
Crossref DOI link: https://doi.org/10.1007/978-3-319-63082-3_42
Published Online: 2018-03-21
Published Print: 2017
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Putek, Piotr
Janssen, Rick
Niehof, Jan
Maten, E. Jan W. ter
Pulch, Roland
Tasić, Bratislav
Günther, Michael
License valid from 2017-01-01