Strong-Field-Assisted Measurement of Near-Fields and Coherent Control of Photoemission at Nanometric Metal Tips
Crossref DOI link: https://doi.org/10.1007/978-3-319-64840-8_8
Published Online: 2017-12-23
Published Print: 2017
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Förster, M.
Paschen, T.
Thomas, S.
Krüger, M.
Hommelhoff, P.
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