The Observation of Transient Thin Film Structures During the Femto-Second Laser Ablation Process by Using the Soft X-Ray Laser Probe
Crossref DOI link: https://doi.org/10.1007/978-3-319-73025-7_40
Published Online: 2018-02-24
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hasegawa, N.
Nishikino, M.
Ishino, M.
Ohnishi, N.
Ito, A. M.
Minami, Y.
Baba, M.
Faenov, A. Ya.
Inogamov, N.
Kawachi, T.
Kondo, K.
Suemoto, T.
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