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Evaluation of a Flat-Field Grazing Incidence Spectrometer for Highly Charged Ion Plasma Emission in 1–10 nm

Crossref DOI link: https://doi.org/10.1007/978-3-319-73025-7_62

Published Online: 2018-02-24

Published Print: 2018

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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