Dissipation Modulated Kelvin Probe Force Microscopy Method
Crossref DOI link: https://doi.org/10.1007/978-3-319-75687-5_2
Published Online: 2018-03-10
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Miyahara, Yoichi
Grütter, Peter
License valid from 2018-01-01
Chapter History
First Online: 10 March 2018