Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques
Crossref DOI link: https://doi.org/10.1007/978-3-319-75895-4_10
Published Online: 2018-05-07
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rodenhausen, Keith B.
Schmidt, Daniel
Rice, Charles
Hofmann, Tino
Schubert, Eva
Schubert, Mathias
License valid from 2018-01-01
Text and Data Mining valid from 2018-01-01
Chapter History
First Online: 7 May 2018