An Overview on Recent Advances in Statistical Burn-In Modeling for Semiconductor Devices
Crossref DOI link: https://doi.org/10.1007/978-3-319-76035-3_26
Published Online: 2018-05-18
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kurz, Daniel
Lewitschnig, Horst
Pilz, Jürgen
License valid from 2018-01-01