New Classes of Blind Quantum Source Separation and Process Tomography Methods Based on Spin Component Measurements Along Two Directions
Crossref DOI link: https://doi.org/10.1007/978-3-319-93764-9_20
Published Online: 2018-06-06
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Deville, Yannick
Deville, Alain
License valid from 2018-01-01
