In Situ Characterization Tools for Bi2Te3 Topological Insulator Nanomaterials
Crossref DOI link: https://doi.org/10.1007/978-3-662-56322-9_7
Published Online: 2018-01-25
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ngabonziza, P.
Stehno, M. P.
Koster, G.
Brinkman, A.
License valid from 2018-01-01