Time-Dependent Degradation in Device Characteristics and Countermeasures by Design
Crossref DOI link: https://doi.org/10.1007/978-4-431-56594-9_6
Published Online: 2018-07-21
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sato, Takashi
Hashimoto, Masanori
Tanakamaru, Shuhei
Takeuchi, Ken
Sato, Yasuo
Kajihara, Seiji
Yoshimoto, Masahiko
Jung, Jinwook
Kimi, Yuta
Kawaguchi, Hiroshi
Shimada, Hajime
Yao, Jun
License valid from 2018-07-21