Using Neuroimaging and Electroencephalography for Prediction of Treatment Resistance in Psychiatric Disorders
Crossref DOI link: https://doi.org/10.1007/978-981-10-4358-1_4
Published Online: 2018-10-30
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yun, Je-Yeon
Lee, Seung-Hwan
Text and Data Mining valid from 2018-10-30