Geometry Scaling Impact on Leakage Currents in FinFET Standard Cells Based on a Logic-Level Leakage Estimation Technique
Crossref DOI link: https://doi.org/10.1007/978-981-10-7329-8_29
Published Online: 2018-01-26
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abbas, Zia
Zahra, Andleeb
Olivieri, Mauro
Mastrandrea, Antonio
License valid from 2018-01-01
Text and Data Mining valid from 2018-01-01
Chapter History
First Online: 26 January 2018