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Comparison of SRAM Cell Layout Topologies to Estimate Improvement in SER Robustness in 28FDSOI and 40 nm Technologies

Crossref DOI link: https://doi.org/10.1007/978-981-10-7470-7_41

Published Online: 2017-12-21

Published Print: 2017

Update policy: https://doi.org/10.1007/springer_crossmark_policy