Characterization and Variable Temperature Modeling of SiC MOSFET
Crossref DOI link: https://doi.org/10.1007/978-981-10-7986-3_28
Published Online: 2018-03-31
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Mengzhu
Guo, Yujia
Wang, Lei
Chen, Guofu
Qiu, Ruichang
License valid from 2018-01-01